Test and measurement systems pose complicated challenges for equipment designers. Automated test equipment (ATE) contain many integrated test instruments for performing tests on devices, referred to as the device under test (DUT). Automated to quickly perform measurements and evaluate the test results, an ATE is capable of testing and diagnosing faults in sophisticated wafer level or packaged electronic parts, including systems on chips and integrated circuits. Automated test equipment designers need high performance, advanced circuit materials with superior electrical properties. That’s why they turn to Rogers.
Rogers’ high frequency laminates are engineered to meet the unique electrical and thermal demands of high speed digital circuit designs like those found in ATE systems. Rogers' circuit materials offer low insertion loss and controlled dielectric constants that enable ATE system and DUT interface card designers the flexibility to perform quick and accurate testing of the most sophisticated electronic components.
